Main 2011 IEEE 17th International On-Line Testing Symposium

2011 IEEE 17th International On-Line Testing Symposium

Name: 2011 IEEE 17th International On-Line Testing Symposium
Rating: 5.0 (4 reviews)
ISBN: 9781457710537

Rajendran, Aravind; Shiyanovskii, Yuriy; Wolff, Frank; Papachristou, Chris

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Request Code : ZLIB.IO17584022

Categories:

Year:

2022

Publisher:

IEEE

Language:

English

ISBN 10:

1457710536

ISBN 13:

9781457710537

ISBN:

9781457710537, 1457710536

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