Main 2010 20th International Conference on Pattern Recognition

2010 20th International Conference on Pattern Recognition

Name: 2010 20th International Conference on Pattern Recognition
Rating: 5.0 (4 reviews)
ISBN: 9781424475421

Raytchev, Bisser; Mino, Tetsuya; Tamaki, Toru; Kaneda, Kazufumi

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Request Code : ZLIB.IO17582943

Categories:

Year:

2022

Publisher:

IEEE

Language:

English

ISBN 10:

1424475422

ISBN 13:

9781424475421

ISBN:

9781424475421, 1424475422

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