Main 2016 IEEE Nuclear Science Symposium, Medical Imaging Conference and Room-Temperature Semiconductor Detector Workshop (NSS/MIC/RTSD)

2016 IEEE Nuclear Science Symposium, Medical Imaging Conference and Room-Temperature Semiconductor Detector Workshop (NSS/MIC/RTSD)

Name: 2016 IEEE Nuclear Science Symposium, Medical Imaging Conference and Room-Temperature Semiconductor Detector Workshop (NSS/MIC/RTSD)
Rating: 5.0 (4 reviews)
ISBN: 9781509016426

Dormenev, V.; Auffray, E.; Brinkmann, K.-T.; Korjik, M.; Lucchini, M. T.; Mechinsky, V.; Novotny, R. W.; Zaunick, H. G.

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Categories:

Year:

2022

Publisher:

IEEE

Language:

English

ISBN 10:

1509016422

ISBN 13:

9781509016426