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2017 IEEE International Electron Devices Meeting (IEDM)
2017 IEEE International Electron Devices Meeting (IEDM)
Nishihara, T.; Matsumura, M.; Imoto, T.; Okumura, K.; Sakano, Y.; Yorikado, Y.; Tashiro, Y.; Wakabayashi, H.; Oike, Y.; Nitta, Y.
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