Main 2019 IEEE/ACM 4th International Workshop on Metamorphic Testing (MET)

2019 IEEE/ACM 4th International Workshop on Metamorphic Testing (MET)

Name: 2019 IEEE/ACM 4th International Workshop on Metamorphic Testing (MET)
Rating: 5.0 (4 reviews)
ISBN: 9781728122359

Dwarakanath, Anurag; Ahuja, Manish; Podder, Sanjay; Vinu, Silja; Naskar, Arijit; Koushik, MV

5.0 / 5.0

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Request Code : ZLIB.IO17436865

Categories:

Year:

2022

Publisher:

IEEE

Language:

English

ISBN 10:

172812235X

ISBN 13:

9781728122359

ISBN:

9781728122359, 172812235X

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