Main VLSI Design and Test: 17th International Symposium, VDAT 2013, Jaipur, India, July 27-30, 2013, Revised Selected Papers
VLSI Design and Test: 17th International Symposium, VDAT 2013, Jaipur, India, July 27-30, 2013, Revised Selected Papers cover

VLSI Design and Test: 17th International Symposium, VDAT 2013, Jaipur, India, July 27-30, 2013, Revised Selected Papers

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This book constitutes the refereed proceedings of the 17th International Symposium on VLSI Design and Test, VDAT 2013, held in Jaipur, India, in July 2013. The 44 papers presented were carefully reviewed and selected from 162 submissions. The papers discuss the frontiers of design and test of VLSI components, circuits and systems. They are organized in topical sections on VLSI design, testing and verification, embedded systems, emerging technology.


Request Code : ZLIBIO1134888
Categories:
Year:
2013
Edition:
1
Publisher:
Springer-Verlag Berlin Heidelberg
Language:
English
Pages:
388
ISBN:
978-3-642-42023-8,978-3-642-42024-5
Series:
Communications in Computer and Information Science 382
This book is not available due to the complaint of the copyright holder.

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